Analytical Imaging Facility

Zeiss Supra 40

 Attention: The NIH requires that all publications using data from this instrument must list SIG # 1S10RR025554-01A1  


Supra 40 is a general purpose ultra high resolution FE-SEM based on the unique GEMINI Technology. Excellent imaging properties combined with analytical capabilities makes this high end FE-SEM suitable for a wide range of applications in life science. The large specimen chamber for the integration of optional detectors and accessories enables the user to configure the Supra 40 for specific applications without sacrificing productivity or efficiency.


microscope zeiss sem(1) Featuring:

  • Operating voltage range from 0.02- 30kV
  • High brightness field-emission gun
  • Windows based Smart SEM control software
  • Everhart Thornley and in-lens secondary electron detectors
  • Backscatter and STEM detectors
  • ATLAS- large area mapping
  • Shuttle & Find for correlative fluorescence and SEM
  • Gatan Alto 2500 cryotransfer system
  • Oxford INCA energy dispersive x-ray microanalysis



Electron Microscopy Preparation
Forchheimer 633NB

Click here to log in